Pascal and Francis Bibliographic Databases

Help

Search results

Your search

ct.\*:("Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements)")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 1527

  • Page / 62
Export

Selection :

  • and

Generic nonsinusoidal fringe model and gamma calibration in phase measuring profilometryXU ZHANG; LIMIN ZHU; YOUFU LI et al.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2012, Vol 29, Num 6, pp 1047-1058, issn 1084-7529, 12 p.Article

Additional Comments on An Essay on Contact Angle Measurements by M. Strobel and C. S. LyonsMONTES RUIZ-CABELLO, Francisco Javier; RODRIGUEZ-VALVERDE, Miguel Angel; CABRERIZO-VILCHEZ, Miguel A et al.Plasma processes and polymers (Print). 2011, Vol 8, Num 5, pp 363-366, issn 1612-8850, 4 p.Article

The identification and repair of anomalous measurements in the measurement of big diameter based on rolling-wheel methodCHEN, Haiou; YU, Xiaofen.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7997, issn 0277-786X, isbn 978-0-8194-8570-0, 79971G.1-79971G.6, 2Conference Paper

Specific features of heat transfer via micro and nanochannels in micro-heat exchangersIOAN, Mihai; CORNEL, Suciu.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7821, issn 0277-786X, isbn 978-0-8194-8330-0, 78212F.1-78212F.6Conference Paper

Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometryBING PAN; QIAN KEMAO; LEI HUANG et al.Optics letters. 2009, Vol 34, Num 4, pp 416-418, issn 0146-9592, 3 p.Article

Precise perimeter measurement for 3D object with a light-pen vision measurement systemXU, Ting-Fa; ZHAO PENG.Optics and laser technology. 2009, Vol 41, Num 6, pp 815-819, issn 0030-3992, 5 p.Article

Simultaneous perimeter measurement for multiple planar objectsZHAO PENG; NI, Guo-Qiang; PU, Zhao-Bang et al.Optics and laser technology. 2009, Vol 41, Num 2, pp 186-192, issn 0030-3992, 7 p.Article

Study of the uncertainty of angle measurement for a rotary-laser automatic theodolite (R-LAT)MUELANER, J. E; WANG, Z; JAMSHIDI, J et al.Proceedings of the Institution of Mechanical Engineers. Part B. Journal of engineering manufacture. 2009, Vol 223, Num 3, pp 217-229, issn 0954-4054, 13 p.Article

Micromagnetic characterization of a rotation sensor based on the planar Hall effectVOLMER, M; NEAMTU, J.Physica. B, Condensed matter. 2008, Vol 403, Num 2-3, pp 350-353, issn 0921-4526, 4 p.Conference Paper

A study on carrier-removal techniques in fringe projection profilometryQUAN, C; TAY, C. J; CHEN, L. J et al.Optics and laser technology. 2007, Vol 39, Num 6, pp 1155-1161, issn 0030-3992, 7 p.Article

Measurement of curvature distribution using digital speckle three-shearing aperture interferometryWANG, K. F; TIEU, A. K; GAO, M. H et al.Optics and laser technology. 2007, Vol 39, Num 5, pp 926-928, issn 0030-3992, 3 p.Article

Random depth access full-field low-coherence interferometry applied to a small punch testEGAN, Patrick; WHELAN, Maurice P; LAKESTANI, Fereydoun et al.Optics and lasers in engineering. 2007, Vol 45, Num 4, pp 523-529, issn 0143-8166, 7 p.Article

Modern techniques of measure and control of deformations : an experimental test: Senerchia landslideCAPRIOLI, M; STRISCIUGLIO, G.WIT transactions on modelling and simulation. 2007, pp 871-880, isbn 978-1-8456-4084-2, 1Vol, 10 p.Conference Paper

A dynamic sampling scheme for GPS integrity assessmentFENG, S; OCHIENG, W; WALSH, D et al.Aeronautical Journal. 2006, Vol 110, Num 1105, pp 129-143, issn 0001-9240, 15 p.Article

The auto-measurement of the gap of LCD glass plates using sub-pixel accuracy estimationLIN, Chern-Sheng; CHO, Jason; LAY, Yun-Long et al.Optik (Stuttgart). 2006, Vol 117, Num 8, pp 349-354, issn 0030-4026, 6 p.Article

Micro-three dimensional shape measurement method based on shadow Moiré using scanning electron microscopyARAI, Y; YOKOZEKI, S.Journal of modern optics (Print). 2006, Vol 53, Num 18, pp 2641-2655, issn 0950-0340, 15 p.Article

Accuracy distribution and determination of the flexible three-coordinate measuring machineCHUNHUA WANG; YETAI FEI; PENGHAO HU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62800U.1-62800U.7, issn 0277-786X, isbn 0-8194-6351-5Conference Paper

Research of measuring accuracy of laser tracker systemOUYANG JIANFEI; LIANG ZHIYONG; ZHANG HAIXIN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62800T.1-62800T.6, issn 0277-786X, isbn 0-8194-6351-5Conference Paper

Accurate roughness measurements by laser interferometer calibration, VFM-uncertainty calculations and noise reductionHAITJEMA, H; MOREL, M. A. A.SPIE proceedings series. 2005, pp 58790I.1-58790I.7, isbn 0-8194-5884-8, 1VolConference Paper

Determination of the sequence of line crossings by means of 3D laser profilometrySPAGNOLO, Giuseppe Schirripa; SIMONETTI, Carla; COZZELLA, Lorenzo et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 59540V.1-59540V.12, issn 0277-786X, isbn 0-8194-5961-5, 1VolConference Paper

Reconstruction of object nonharmonic motion function by diode laser signal operating in autodyne regimeCHANILOV, Oleg I; USANOV, Dmitry A; SKRIPAL, Anatoli V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 193-198, issn 0277-786X, isbn 0-8194-5753-1, 1Vol, 6 p.Conference Paper

Real-time measurement of multi-point distance and displacement by fourier transform technique using optical frequency modulationSHINODA, Y; ITOH, M; NICHOGI, M et al.SICE annual conference. 2004, pp 1567-1572, isbn 4-907764-22-7, 3Vol, 6 p.Conference Paper

High-resolution transmission electron microscopy calibration of critical dimension (CD) reference materialsALLEN, Richard A; HEADLEY, Thomas J; EVERIST, Sarah C et al.IEEE transactions on semiconductor manufacturing. 2001, Vol 14, Num 1, pp 26-31, issn 0894-6507Article

The partial plane level of terrace and its testLIU, Ya-Nan; ZENG, Jian-Kang; LIU, Jun-Qu et al.SPIE proceedings series. 2000, pp 251-254, isbn 0-8194-3718-2Conference Paper

A laser three-focus velocimeter using an array of laser diodes for simultaneous measurement of particle size and velocityNAKATANI, N; OSHIO, T; SAKABE, T et al.Review of scientific instruments. 1993, Vol 64, Num 2, pp 331-337, issn 0034-6748Article

  • Page / 62